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[IEEE 2010 IEEE Energy Conversion Congress and Exposition (ECCE) - Atlanta, GA, USA (2010.09.12-2010.09.16)] 2010 IEEE Energy Conversion Congress and Exposition - Modeling the inter-electrode capacitances of Si CoolMOS transistors for circuit simulation of high efficiency power systems
Yang, Nanying, Ortiz, Jose M., Duong, Tam, Hefner, Allen, Meehan, Kathleen, Lai, Jih-ShengYear:
2010
Language:
english
Pages:
8
DOI:
10.1109/ecce.2010.5618009
File:
PDF, 728 KB
english, 2010