Strain-driven phase boundaries in BiFeO_{3} thin films studied by atomic force microscopy and x-ray diffraction
Liu, Heng-Jui, Liang, Chen-Wei, Liang, Wen-I, Chen, Hsiang-Jung, Yang, Jan-Chi, Peng, Chun-Yen, Wang, Guang-Fu, Chu, Feng-Nan, Chen, Yi-Chun, Lee, Hsin-YiVolume:
85
Year:
2012
Language:
english
DOI:
10.1103/physrevb.85.014104
File:
PDF, 1.10 MB
english, 2012