Yield Stress Measurement of Silicon Nitride Suspensions

Yield Stress Measurement of Silicon Nitride Suspensions

Lixuan Zhu, Kyriakos Papadopoulos, Daniel De Kee
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Volume:
80
Year:
2002
Language:
english
Pages:
6
DOI:
10.1002/cjce.5450800619
File:
PDF, 2.43 MB
english, 2002
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