Determination of relative electron inelastic mean free...

Determination of relative electron inelastic mean free paths (escape depths) and photoionisation cross-sections by X-ray photoelectron spectroscopy

Cadman, Philip, Evans, Stephen, Scott, John D., Thomas, John M.
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Volume:
71
Year:
1975
Language:
english
DOI:
10.1039/f29757101777
File:
PDF, 689 KB
english, 1975
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