Determination of relative electron inelastic mean free paths (escape depths) and photoionisation cross-sections by X-ray photoelectron spectroscopy
Cadman, Philip, Evans, Stephen, Scott, John D., Thomas, John M.Volume:
71
Year:
1975
Language:
english
DOI:
10.1039/f29757101777
File:
PDF, 689 KB
english, 1975