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Establishing Best-Practice Modeling Approaches for Understanding Single-Event Transients in Gb/s SiGe Digital Logic
Moen, Kurt A., Phillips, Stanley D., Kenyon, Eleazar W., Cressler, John D.Volume:
59
Language:
english
Pages:
7
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2011.2179946
Date:
August, 2012
File:
PDF, 1.15 MB
english, 2012