Exploitation of Surface-Sensitive Electrons in Scanning...

Exploitation of Surface-Sensitive Electrons in Scanning Electron Microscopy Reveals the Formation Mechanism of New Cubic and Truncated Octahedral CeO2 Nanoparticles

Shunsuke Asahina, Dr. Seiichi Takami, Takeshi Otsuka, Prof. Tadafumi Adschiri, Prof. Osamu Terasaki
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Volume:
3
Year:
2011
Language:
english
Pages:
7
DOI:
10.1002/cctc.201000348
File:
PDF, 894 KB
english, 2011
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