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Strongly Reduced Si Surface Recombination by Charge Injection during Etching in Diluted HF/HNO3
Stefanie M. Greil, Dr. Andreas Schöpke, Dr. Jörg RappichVolume:
13
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/cphc.201200269
File:
PDF, 1.16 MB
english, 2012