![](/img/cover-not-exists.png)
Analysis of parasitic resistance effects in MOS LSI
Kenji Anami, Masahiko Yoshimoto, Hirofumi Shinohara, Osamu Tomisawa, Takao NakanoVolume:
66
Year:
1983
Language:
english
Pages:
8
DOI:
10.1002/ecja.4400661013
File:
PDF, 508 KB
english, 1983