Analysis of soft error in MOS dynamic RAM

Electronics and Communications in Japan (Part I: Communications)) 1982 Vol. 65; Iss. 4

Analysis of soft error in MOS dynamic RAM

Tsutomu Yoshihara, Satoshi Takano, Makoto Taniguchi, Hiroshi Harada, Takao Nakano
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Volume:
65
Year:
1982
Language:
english
Pages:
6
DOI:
10.1002/ecja.4410650414
File:
PDF, 315 KB
english, 1982
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