A method of yield analysis for analog–integrated circuits...

A method of yield analysis for analog–integrated circuits using spherical surface random numbers

Yoichi Jyo, Hiroshi Ikeda, Suemitsu Minamoto, Yoshiaki Kojima
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
70
Year:
1987
Language:
english
Pages:
9
DOI:
10.1002/ecja.4410701203
File:
PDF, 493 KB
english, 1987
Conversion to is in progress
Conversion to is failed