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A method of yield analysis for analog–integrated circuits using spherical surface random numbers
Yoichi Jyo, Hiroshi Ikeda, Suemitsu Minamoto, Yoshiaki KojimaVolume:
70
Year:
1987
Language:
english
Pages:
9
DOI:
10.1002/ecja.4410701203
File:
PDF, 493 KB
english, 1987