Malfunction of digital circuits caused by noise induced in...

Malfunction of digital circuits caused by noise induced in breaking electric contacts

Keiichi Uchimura, Junji Michida, Shinji Nozu, Teizo Aida
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Volume:
72
Year:
1989
Language:
english
Pages:
11
DOI:
10.1002/ecja.4410720607
File:
PDF, 630 KB
english, 1989
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