Malfunction of digital circuits caused by noise induced in breaking electric contacts
Keiichi Uchimura, Junji Michida, Shinji Nozu, Teizo AidaVolume:
72
Year:
1989
Language:
english
Pages:
11
DOI:
10.1002/ecja.4410720607
File:
PDF, 630 KB
english, 1989