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A two-dimensional reliability simulator (2P/IMPAC) and its application to LDD MOS devices
Shinji Onga, Masashi Wada, Masami KonakaVolume:
69
Year:
1986
Language:
english
Pages:
9
DOI:
10.1002/ecjb.4420690408
File:
PDF, 593 KB
english, 1986