Examination of picosecond GaAs HEMT photodetector

Examination of picosecond GaAs HEMT photodetector

Tokuo Umeda, Yoshio Cho
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Volume:
71
Year:
1988
Language:
english
Pages:
7
DOI:
10.1002/ecjb.4420711106
File:
PDF, 500 KB
english, 1988
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