Influence of the Ta migration on dielectric properties of...

Influence of the Ta migration on dielectric properties of anodized Al-Ta(N)-Al trilayered oxide films

Tsuyoshi Dobashi, Toshiji Umezawa, Katsutaka Sasaki, Atsushi Noya
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
72
Year:
1989
Language:
english
Pages:
8
DOI:
10.1002/ecjb.4420720903
File:
PDF, 561 KB
english, 1989
Conversion to is in progress
Conversion to is failed