Delay-time evaluation of submicron BiCMOS, CMOS, and...

Electronics and Communications in Japan (Part II: Electronics)) 1991 Vol. 74; Iss. 5

Delay-time evaluation of submicron BiCMOS, CMOS, and bipolar ecl gates

Hisayuki Higuchi, Suguru Tachibana, Makoto Suzuki
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Volume:
74
Year:
1991
Language:
english
Pages:
12
DOI:
10.1002/ecjb.4420740509
File:
PDF, 819 KB
english, 1991
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