Analysis of short-channel effect in thin-film SOI MOS...

Analysis of short-channel effect in thin-film SOI MOS transistor

Kaori Nakamura, Yasuyuki Okura, Eiji Takeda, Ryuiti Izawa
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Volume:
74
Year:
1991
Language:
english
Pages:
8
DOI:
10.1002/ecjb.4420740808
File:
PDF, 527 KB
english, 1991
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