AC hot-carrier degradation due to gate-pulse-induced noise

AC hot-carrier degradation due to gate-pulse-induced noise

Ryuichi Izawa, Kazunori Umeda, Eiji Takeda
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Volume:
74
Year:
1991
Language:
english
Pages:
8
DOI:
10.1002/ecjb.4420741106
File:
PDF, 525 KB
english, 1991
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