Fixed pattern noise from charge transfer loss in CCD imager

Fixed pattern noise from charge transfer loss in CCD imager

Yoshio Ohkubo, Masanori Ohmae, Kiyotsugu Ishikawa
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Volume:
76
Year:
1993
Language:
english
Pages:
9
DOI:
10.1002/ecjb.4420760306
File:
PDF, 637 KB
english, 1993
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