![](/img/cover-not-exists.png)
Fixed pattern noise from charge transfer loss in CCD imager
Yoshio Ohkubo, Masanori Ohmae, Kiyotsugu IshikawaVolume:
76
Year:
1993
Language:
english
Pages:
9
DOI:
10.1002/ecjb.4420760306
File:
PDF, 637 KB
english, 1993