Dynamic characteristics of leakage current in amorphous...

Dynamic characteristics of leakage current in amorphous silicon thin-film transistors

Tomonobu Motai, Kouhei Suzuki, Kouji Suzuki
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Volume:
76
Year:
1993
Language:
english
Pages:
6
DOI:
10.1002/ecjb.4420761009
File:
PDF, 388 KB
english, 1993
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