Electronics and Communications in Japan (Part III: Fundamental Electronic Science))
1993 Vol. 76; Iss. 12
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Test generation for sequential circuits based on boolean function manipulation
Hoyong Choi, Takashi Kohara, Nagisa Ishiura, Isao Shirakawa, Akira MotoharaVolume:
76
Year:
1993
Language:
english
Pages:
11
DOI:
10.1002/ecjc.4430761207
File:
PDF, 889 KB
english, 1993