VLSI reliability: Contributions from a three year national...

Transactions on Emerging Telecommunications Technologies 1990 Vol. 1; Iss. 2

VLSI reliability: Contributions from a three year national research program

Giovanni Soncini, Claudio Canali, E. Zanoni, Francrsco Cors, Alessandro Diligenti, Fausto Fantini, Vito A. Monaco, Guido Masetti, Carlo Morandi
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Volume:
1
Year:
1990
Language:
english
Pages:
12
DOI:
10.1002/ett.4460010221
File:
PDF, 1.27 MB
english, 1990
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