An on-wafer method for C-V characterization of...

An on-wafer method for C-V characterization of heterostructure diodes

Jan Stake, Hans Grönqvist
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Volume:
9
Year:
1995
Language:
english
Pages:
4
DOI:
10.1002/mop.4650090202
File:
PDF, 441 KB
english, 1995
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