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Threshold voltage stability comparison in AlGaN/GaN FLASH MOS-HFETs utilizing charge trap or floating gate charge storage
Casey Kirkpatrick, Bongmook Lee, YoungHwan Choi, Alex Huang, Veena MisraVolume:
9
Year:
2012
Language:
english
Pages:
4
DOI:
10.1002/pssc.201100421
File:
PDF, 629 KB
english, 2012