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Growth and stacking fault reduction in semi-polar GaN films on planar Si(112) and Si(113)
Roghaiyeh Ravash, Peter Veit, Mathias Müller, Gordon Schmidt, Anja Dempewolf, Thomas Hempel, Jürgen Bläsing, Frank Bertram, Armin Dadgar, Jürgen Christen, Alois KrostVolume:
9
Year:
2012
Language:
english
Pages:
4
DOI:
10.1002/pssc.201100532
File:
PDF, 904 KB
english, 2012