Detecting efficiency-limiting defects in Czochralski-grown silicon wafers in solar cell production using photoluminescence imaging
Jonas Haunschild, Isolde E. Reis, Juliane Geilker, Stefan ReinVolume:
5
Year:
2011
Language:
english
Pages:
3
DOI:
10.1002/pssr.201105183
File:
PDF, 408 KB
english, 2011