Analysis of Confidence Lower Limits of Reliability and...

Quality and Reliability Engineering International 2012 Vol. aop; Iss. aop

Analysis of Confidence Lower Limits of Reliability and Hazard Rate for Electronic Stability Control Systems

Shiwen Niu, Wei Zhan
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Volume:
aop
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/qre.1380
File:
PDF, 262 KB
english, 2012
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