Reliability characterization of a 3-mum cmos/sos process

Reliability characterization of a 3-mum cmos/sos process

M. Patrick Dugan
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Volume:
3
Year:
1987
Language:
english
Pages:
7
DOI:
10.1002/qre.4680030207
File:
PDF, 698 KB
english, 1987
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