A computer-controlled environmental test system for high...

Quality and Reliability Engineering International 1993 Vol. 9; Iss. 2

A computer-controlled environmental test system for high pin-count integrated circuit packages

John Barrett, John Ó Donavan, Thomas Hayes, Seán C.Ó Mathúna
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Volume:
9
Year:
1993
Language:
english
Pages:
10
DOI:
10.1002/qre.4680090206
File:
PDF, 901 KB
english, 1993
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