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Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components
W. Claeys, S. Dilhaire, V. Quintard, J. P. Dom, Y. DantoVolume:
9
Year:
1993
Language:
english
Pages:
6
DOI:
10.1002/qre.4680090411
File:
PDF, 526 KB
english, 1993