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Localized Grounding, Excavation, and Dissection Using In-Situ Probe Techniques for Focused Ion Beam and Scanning Electron Microscopy: Experiments With Rock Varnish
Jeffrey Ditto, David Krinsley, Kurt LangworthyVolume:
34
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/sca.21010
File:
PDF, 683 KB
english, 2012