Electron and ion microscopy and microanalysis principles and applications, 2nd ed., revised and expanded by Lawrence E. Murr Marcel Dekker, New York (1991) ISBN 08247 8556-8; 837 pages + xiv price: $195.00
Dale E. NewburyVolume:
14
Year:
1992
Language:
english
Pages:
2
DOI:
10.1002/sca.4950140512
File:
PDF, 566 KB
english, 1992