Low-temperature scanning electron microscopy in fungus-nematode interaction
E. Den Belder, A. Boekestein, J. W. J. Van Esch, F. ThielVolume:
15
Year:
1993
Language:
english
Pages:
6
DOI:
10.1002/sca.4950150106
File:
PDF, 1.91 MB
english, 1993