Consideration on automatic defect detection algorithm for...

Systems and Computers in Japan 1989 Vol. 20; Iss. 8

Consideration on automatic defect detection algorithm for stamped patterns in electronic parts

Yoshihiro Shima, Seiji Kashioka, Toshikazu Yasue
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Volume:
20
Year:
1989
Language:
english
Pages:
11
DOI:
10.1002/scj.4690200805
File:
PDF, 860 KB
english, 1989
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