Simultaneous detection and localization of secondary ions...

Surface and Interface Analysis 2012 Vol. aop; Iss. aop

Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts

M. J. Eller, S. V. Verkhoturov, F. A. Fernandez-Lima, J. D. DeBord, E. A. Schweikert, S. Della-Negra
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Volume:
aop
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/sia.4949
File:
PDF, 172 KB
english, 2012
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