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The effects of a combined thermal treatment of substrate heating and post-annealing on the microstructure of InGaZnO films and the device performance of their thin film transistors
Mi Ran Moon, Sekwon Na, Haseok Jeon, Tae Hun Lee, Donggeun Jung, Hyoungsub Kim, Jun-Mo Yang, Hoo-Jeong LeeVolume:
aop
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/sia.4968
File:
PDF, 652 KB
english, 2012