Time-of-flight SIMS depth profiling of Na in SiO2 glass...

Time-of-flight SIMS depth profiling of Na in SiO2 glass using C60 sputter ion beam

Daisuke Kobayashi, Yuichi Yamamoto, Tsuguhide Isemura
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
aop
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/sia.5056
File:
PDF, 145 KB
english, 2012
Conversion to is in progress
Conversion to is failed