Characterization of individual nano-objects with...

Surface and Interface Analysis 2012 Vol. aop; Iss. aop

Characterization of individual nano-objects with nanoprojectile-SIMS

C.-K. Liang, S. V. Verkhoturov, Y. Bisrat, S. Dikler, J. D. DeBord, F. A. Fernandez-Lima, E. A. Schweikert, S. Della-Negra
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Volume:
aop
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/sia.5084
File:
PDF, 251 KB
english, 2012
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