Oxygen accumulation effect for depth profiling of...

Oxygen accumulation effect for depth profiling of thin-multilayered sample using low-energy oxygen ion beam

Suguru Nishinomiya, Naoyoshi Kubota, Shun-ichi Hayashi, Hisataka Takenaka
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Volume:
aop
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/sia.5107
File:
PDF, 245 KB
english, 2012
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