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Methods for yeast characterization from industrial products
Luiz H Gomes, Keila M.R Duarte, Juan L Argueso, Sergio Echeverrigaray, Flavio C.A TavaresVolume:
17
Year:
2000
Language:
english
Pages:
7
DOI:
10.1006/fmic.1999.0306
File:
PDF, 540 KB
english, 2000