XPS- and AES-investigations of electron and ion beam...

XPS- and AES-investigations of electron and ion beam induced effects on SK16 glass surfaces

U. Rothhaar, V. Rupertus, H. Oechsner
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Volume:
346
Language:
english
Pages:
3
DOI:
10.1007/bf00321390
Date:
May, 1993
File:
PDF, 307 KB
english, 1993
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