Quantitative electron probe microanalysis for the...

Quantitative electron probe microanalysis for the characterization of thin carbon-boron layers in fusion devices

Peter Karduck, Norbert Ammann, Hans Günter Esser, Jörg Winter
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Volume:
341
Language:
english
Pages:
5
DOI:
10.1007/bf00321926
Date:
October, 1991
File:
PDF, 492 KB
english, 1991
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