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Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysis
R. Delhez, Th. H. Keijser, E. J. MittemeijerVolume:
312
Year:
1982
Language:
english
Pages:
16
DOI:
10.1007/bf00482725
File:
PDF, 1.46 MB
english, 1982