Depth profiles of Ta2O5/SiO2/Si structures: a combined...

Depth profiles of Ta2O5/SiO2/Si structures: a combined X-ray photoemission, Auger electron, and secondary ion mass spectroscopic study

P. Gimmel, B. Gompf, D. Schmeißer, W. Göpel
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
333
Year:
1989
Language:
english
Pages:
4
DOI:
10.1007/bf00572354
File:
PDF, 434 KB
english, 1989
Conversion to is in progress
Conversion to is failed