Investigation of deep states in thin films of hydrogenated amorphous silicon by photo-induced current transient spectroscopy
J. Herion, M. Tapiero, J. P. Zielinger, N. Benjelloun-Saki, W. BeyerVolume:
333
Year:
1989
Language:
english
Pages:
4
DOI:
10.1007/bf00572371
File:
PDF, 356 KB
english, 1989