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Relationship of the actual and the normalized reliability of the means of measurement technology
V. S. Labunets, A. B. Markovich, V. P. Redkina, P. V. NovitskiiVolume:
16
Language:
english
Pages:
2
DOI:
10.1007/bf00815009
Date:
June, 1973
File:
PDF, 157 KB
english, 1973