Dose dependence of defect formation in SiO2irradiated with electrons and gamma rays
V. T. Gritsyna, V. V. Zaionchkovskii, T. I. Korneeva, N. I. PolyakovVolume:
24
Language:
english
Pages:
5
DOI:
10.1007/bf00894495
Date:
January, 1981
File:
PDF, 457 KB
english, 1981