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Comparability and Reliability of High-Pressure Band-Gap Data in Tetrahedral Semiconductors
M. D. Frogley, D. J. DunstanVolume:
211
Year:
1999
Language:
english
Pages:
6
DOI:
10.1002/(sici)1521-3951(199901)211:13.0.co;2-2
File:
PDF, 181 KB
english, 1999