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Raman and RAS Measurements on Uniaxially Strained Thin Semiconductor Layers
E. Liarokapis, D. Papadimitriou, J. Rumberg, W. RichterVolume:
211
Year:
1999
Language:
english
Pages:
8
DOI:
10.1002/(sici)1521-3951(199901)211:13.0.co;2-w
File:
PDF, 204 KB
english, 1999