X-Ray Absorption Spectroscopy Applied to Pressure-Induced...

X-Ray Absorption Spectroscopy Applied to Pressure-Induced Transformations of Semiconductors

J. P. Itié, V. Briois, D. Martinez-Garcia, A. Polian, A. San-Miguel
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Volume:
211
Year:
1999
Language:
english
Pages:
11
DOI:
10.1002/(sici)1521-3951(199901)211:13.0.co;2-b
File:
PDF, 312 KB
english, 1999
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