Measuring depth of point defects in polished surfaces by...

Measuring depth of point defects in polished surfaces by means of a linnik microinterferometer

B. A. Chunin
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Volume:
12
Language:
english
Pages:
2
DOI:
10.1007/bf00985808
Date:
February, 1969
File:
PDF, 107 KB
english, 1969
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